Knowledge that Transforms

For the 1st time, we directly measured the potential distribution inside org. semiconductors. Combined spectroscopic measurements are performed on MDMO-PPV layers on Au and Yb substrates, using a scanning tunneling microscope (STM). The results are analyzed with a model that treats both current injection and bulk transport in detail. Tip height-bias curves, which are taken by following the height of the STM tip as a function of bias, while the STM feedback system is active, reflect the potential distribution between tip and sample electrode